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Im4000 Ion Milling Machine

  • Ion Milling System IM4000Plus : Hitachi High-Tech in Europe

    The Hitachi IM4000Plus Ar ion milling system provides two milling configurations in a single instrument. Previously two separate systems were needed to perform both cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), but with Hitachi's IM4000Plus, both applications can be run within the same machine.

  • Brochure IM4000 Ion Milling System : Hitachi High-Tech

    Brochure IM4000 Ion Milling System. The new Hitachi IM4000 Ar ion milling system offers cross-section and flat ion milling configurations in one instrument. Hitachi IM4000 Ion Milling E-Brochure HTD-E197R.pdf (PDF format, 1,623kBytes) page top.

  • Introduction of the IM4000 optional device SI NEWS

    Introduction. The Hitachi IM4000 Ion Milling System (hereinafter simply the IM4000) was released in late 2010 1) as a device offering two key features: (a) as a hybrid ion-milling machine supporting both cross-section and flat milling—two widely used types of ion milling—the machine meets a wide variety of needs spanning the fields of material science and device engineering, and (b) the

  • IM4000 Ion Milling System Hitachi High-Tech Europe GmbH

    Hitachi Ion Milling System Example Application Data (Flat Milling) Example Application Data (Cross-section Milling) Grinding flaws and smearing from mechanical polishing can easily be removed by the IM4000. The metal and alloy interfaces are now clearly visible, including enhanced contrast via ion milling after only five minutes.

  • Hitachi IM4000 ion milling system engineering.virginia.edu

    Hitachi IM4000 ion milling system. Flat milling of surfaces for SEM and cross sectional milling using argon ions Location: Jesser Hall room 131 . The Hitachi IM4000 system is used as the final preparation step to obtain flat samples for SEM and for hardness testing. The IM4000 also allows preparation of large cross sections of samples by using

  • Ion Milling System IM4000 YouTube

    May 10, 2013· Hybrid model:Dual Milling Configuration Available.hitachi-hitec/global/em/peripheral/im4000.html

  • ION MILLING IM4000 « Norwegian Micro and Nano

    The Hitachi IM4000 Ar ion milling system makes two milling configurations available in a single instrument. While previously two separate systems were needed to perform both, cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), Hitachi's new IM4000 now allows to run both applications within the same machine.

  • Hitachi Ion Milling System

    cross-section milling Sample Observation during Ion Milling The IM4000 has an observation port, for in-situ specimen observation. In addition, when using the stereoscopic microscope (option: Binocular type or Tri-eye type) for sample observation during ion milling, the processing surface can be observed up to 100 times magnification.

  • IM4000 Ion Milling System Hitachi High-Tech Europe GmbH

    Hitachi Ion Milling System Example Application Data (Flat Milling) Example Application Data (Cross-section Milling) Grinding flaws and smearing from mechanical polishing can easily be removed by the IM4000. The metal and alloy interfaces are now clearly visible, including enhanced contrast via ion milling after only five minutes.

  • Hitachi IM4000 Ion Milling E-Brochure HTD allergies

    Hitachi IM4000 Ion Milling E-Brochure HTD. download Report . Comments . Transcription . Hitachi IM4000 Ion Milling E-Brochure HTD

  • Broad Beam Ion Mill Systems « Chip Targets

    Broad Beam Ion Mill. At Chip Targets, we used two in-house broad beam ion mill machines to perform ion mill cross-sections and ion mill polishings: The Hitachi IM4000. The Leica/Baltec RES101. The Hitachi IM4000 and the Leica RES101 are broadbeam ion mill systems. Therefore, they are designed for large area milling where it has its advantage

  • argon ion milling machine

    argon ion milling machine im4000 ion milling machine IM4000 Ion Milling System s new IM4000 now allows to run both applications within the same machine The new Ar ion gun design of the IM4000 offers the Ask Detail argon ion milling 2.2. JEOL EM-09100IS argon ion slicer Similar to conventional argon ion milling ArIS produces a wedge of which the

  • The FlexSEM 1000: A Scanning Electron Microscope

    The specimen was milled by Hitachi High-Tech's IM4000 ion-milling machine and subjected to X-ray analysis under low-vacuum conditions without evaporation. Oxygen, titanium, and zinc were detected in the impurity regions. In the backscattered electron images, the high-contrast striped pattern corresponds to regions in which zinc has segregated.

  • Ion Beam Etch & Milling Systems Intlvac

    Ion Beam Etch (IBE) & Milling technology allows films to be etched or deposited by the use of beams of charged ions in a high vacuum system. For etching (often called 'milling'), the ion beam is directed at the substrate that is patterned, or blank in some applications, and the bombardment of the substrate is well defined and controlled.

  • Argon Ion Milling Machine (presented at ISTFA 2012) YouTube

    Nov 14, 2012· The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique business venue for equipment suppliers, users and a.

  • Author: asminternational
  • Equipment Yale Institute for Nanoscience and Quantum

    Hitachi IM4000 ion mill The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating.

  • NEW: 3-axis milling system by Hitachi High-Technologies

    The IM4000Plus Series Ion-Milling Systems are the second-generation of IM4000 series hybrid instruments that support Cross-Section Milling and Flatmilling®. A wide variety of system configurations are available: Standard, Cooling, Air Protection, and Cooling & Air Protection. Features Faster milling with improved ion optics (> 500 μm/h at 6 kV) Intermittent milling process for heat

  • 3-axis CNC milling machine IM4000Plus Hitachi High

    The Hitachi IM4000Plus Ar ion milling system provides two milling configurations in a single instrument. Previously two separate systems were needed to perform both cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), but with Hitachi's IM4000Plus, both applications can be run within the same machine.

  • Microstructure and mechanical properties of sintered Ag

    Jan 15, 2019· Die shear position height from the substrate surface was set at 50 μm. Five samples were used to measure the average die shear strength. The cross section of sinter Ag joint was prepared by an ion-milling machine (IM4000, Hitachi, Japan), and the microstructure was observed by SEM. Download : Download high-res image (55KB)

  • From transistors to bumps: Preparing SEM cross-sections by

    Broad Ion Beam Milling The BIB milling system is a specimen preparation device (FIGURE 3c) for SEM and surface analysis (EDX[4], EBSP[5], etc.). The device uses a defocused beam of argon ions that sputter material from the target specimen at a rate up to 2-500μm/hour, depending on the mode used.

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  • ION MILLING IM4000 « Norwegian Micro and Nano

    The Hitachi IM4000 Ar ion milling system makes two milling configurations available in a single instrument. While previously two separate systems were needed to perform both, cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), Hitachi's new IM4000 now allows to run both applications within the same machine.

  • Ion Milling System IM4000Plus-产品展示-苏州倍晟美半导体有限

    The Hitachi IM4000Plus Ar ion milling system provides two milling configurations in a single instrument. Previously two separate systems were needed to perform both cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), but with Hitachi's IM4000Plus, both applications can be run within the same machine.

  • Hitachi IM4000 Ion Milling E-Brochure HTD allergies

    Hitachi IM4000 Ion Milling E-Brochure HTD. download Report . Comments . Transcription . Hitachi IM4000 Ion Milling E-Brochure HTD

  • NEW: 3-axis milling system by Hitachi High-Technologies

    The IM4000Plus Series Ion-Milling Systems are the second-generation of IM4000 series hybrid instruments that support Cross-Section Milling and Flatmilling®. A wide variety of system configurations are available: Standard, Cooling, Air Protection, and Cooling & Air Protection. Features Faster milling with improved ion optics (> 500 μm/h at 6 kV) Intermittent milling process for heat

  • Equipment Yale Institute for Nanoscience and Quantum

    Hitachi IM4000 ion mill The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating.

  • argon ion milling machine

    argon ion milling machine im4000 ion milling machine IM4000 Ion Milling System s new IM4000 now allows to run both applications within the same machine The new Ar ion gun design of the IM4000 offers the Ask Detail argon ion milling 2.2. JEOL EM-09100IS argon ion slicer Similar to conventional argon ion milling ArIS produces a wedge of which the

  • MCF Equipment Group SUMS Georgia Tech Shared User

    Hitachi IM4000 Ion Mill: Ar Ion mill for EM sample preparation, cross-sectioning, and surface polishing. Hitachi SU8010 SEM: 1.0nm resolution( Secondary electron detector) at 15 kV and 1.3 nm at 1 kV. 2.0nm resolution (Backscattered electron detector) at 15KV . Operating voltage range 100 V 30 kV High resolution image grabber up to

  • Flat Ion Milling System IM-3000 Hitachi High-Tech Europe

    Hitachi Flat Milling System Effective for removal of sample surface layer or the final finish of mechanical polish Desktop and Compact Design Available beam irradiation angle 0 to 90° Process the range of ö5 mm uniformly Maximum specimen size ö50mm×H25mm

  • EMU Specimen Preparation Equipment UNSW Mark

    Ion milling. Gatan PIPS Model 695 Hitachi IM4000 Ion Milling System. Coater. Leica ACE600 sputter coater Emitech K550x Gold sputter coater Emitech K575x Pt sputter coater Emitech K575x with Evaporative Carbon coating accessory JEOL JEE-420 Evaporative coater DCT Desktop Carbon coater. Ultramicrotome. Leica EM UC6 Ultramicrotome

  • All Hitachi High-Tech Europe GmbH catalogs and technical

    IM4000 Ion Milling System. 5 Pages. Analytical Variable Pressure FE-SEM SU6600. 7 Pages. Hitachi SU9000. 2 Pages. Ultra-High-Resolution Analytical FE-SEM SU-70. 8

  • Ion Beam Etch & Milling Systems Intlvac

    Ion Beam Etch (IBE) & Milling technology allows films to be etched or deposited by the use of beams of charged ions in a high vacuum system. For etching (often called 'milling'), the ion beam is directed at the substrate that is patterned, or blank in some applications, and the bombardment of the substrate is well defined and controlled.

  • Tabletop Microscope, TM3030 Hitachi High-Tech Europe

    Application Gallery Flat/ cross-section milling Observation of biological specimen Biological specimen Specimen treated by Hitachi Ion Milling System TM3030 can be used to check the surface of specimen after milling. It is possible to transfer the specimen stub of IM4000 directly to the TM3030.

  • Hitachi SU9000 Hitachi High-Tech Europe GmbH PDF

    IM4000 Ion Milling System. 5 Pages. Analytical Variable Pressure FE-SEM SU6600. 7 Pages. Ultra-High-Resolution Analytical FE-SEM SU-70. 8 Pages. ZONESem Desktop EM Sample Cleaner. 2 Pages. Flat Ion Milling System IM-3000. 2 Pages. GXH-1JS DIRECT DRIVE MODULAR MOUNTER Hitachi spectrometer; CNC milling machine; 3D software; Optical microscope

  • ball milling method explanation examples

    Milling Machine: Methods of Milling Milling Processes Milling is an important process of manufacturing technology and basically it refers to the removal of metal from the piece using a tool which has several cutting points and is rotating about its axis Thus each cutting point removes a little bit of the metal but since there are multiple such points and the tool is rotating at a fast speed